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Advances in Contactless Silicon Defect and Impurity Diagnostics Based on Lifetime Spectroscopy and Infrared Imaging
Impurity Diagnostics Lifetime Spectroscopy
2008/10/30
This paper gives a review of some recent developments in the field of contactless silicon wafer characterization techniques based on lifetime spectroscopy and infrared imaging. In the first part of th...
Porosity of sol-gel silica glasses doped by ruthenium bipyridyl as measured by positron annihilation lifetime spectroscopy and nitrogen adsorption
porous glasses ruthenium tris bipyridyl chloride pore size liquid nitrogen adsorption method
2011/4/27
The porous structure of glasses incorporated by ruthenium tris bipyridyl chloride (further Rubpy) and adsorbed by Rubpy is studied by positron annihilation lifetime spectroscopy and liquid nitrogen ad...