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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems.
Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector
electrical connector performance degradation reliability
2011/8/4
As few or no failures occur during accelerated life test, it is difficult to assess reliability for long-life products with traditional life tests. Reliability assessment using degradation data of pro...
Development of a Lowcost Hardwareintheloop Simulation System as a Test Bench for Antilocked Braking System
hardwareintheloop simulation(HILS) antilocked braking system(ABS)
2011/8/4
Nowadays validation of antilocked braking system(ABS) systems relies mainly on a large amount of road tests.